Efficient Integrated Circuits Characterization Through Computer Vision Assistance - Archive ouverte HAL
Communication Dans Un Congrès Année : 2020
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hal-03120043 , version 1 (25-01-2021)

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Raphael Abele, Jean-Luc Damoiseaux, Daniele Fronte, Pierre-Yvan Liardet, Jean-Marc Boi, et al.. Efficient Integrated Circuits Characterization Through Computer Vision Assistance. 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Sep 2020, Vienna, France. pp.1247-1250, ⟨10.1109/ETFA46521.2020.9211922⟩. ⟨hal-03120043⟩
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