Reconstruction of partially sampled STEM-EELS images with atomic resolution
Résumé
Electron microscopy has shown to be a powerful tool to ana-lyze chemical composition of samples. However, acquiring a high qualityimage is hard due to radiation damages which limit the signal-to-noiseratio. One solution, considered in this work, consists in spatially partiallyacquiring the multi-band image and reconstructing it afterwards. Wepropose a reconstruction algorithm, referred to as Fourier sparsity in3D (FS3D), based on a regularization specifically tailored for atomicallyresolved images. Experiments show that the proposed FS3D method leadsto state-of-the-art results with a significantly lighter computational cost.
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