Temporal metrology for advanced ultrashort XUV sources - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Journal of Physics: Conference Series Année : 2020

Temporal metrology for advanced ultrashort XUV sources

Résumé

Synopsis A new VMI spectrometer has been developed in order to enable the single-shot characterization of different ultrashort XUV sources through laser-dressed photoionization. The instrument has been commissioned with a plasma-based XUV laser and, then, implemented on a high harmonics source based on a plasma mirror.

Dates et versions

cea-04444577 , version 1 (07-02-2024)

Identifiants

Citer

T Sinyakova, C Bomme, C Bourassin-Bouchet, L Chopineau, D Cubaynes, et al.. Temporal metrology for advanced ultrashort XUV sources. Journal of Physics: Conference Series, 2020, 1412 (7), pp.072022. ⟨10.1088/1742-6596/1412/7/072022⟩. ⟨cea-04444577⟩
43 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More