We present a simulation strategy using ATLAS-2D to optimize the back-contact hole grid (i.e. size and pitch of openings) of the Al2O3-rear-passivation layer in ultra-thin CIGS photovoltaic cells. We first discuss and compare our simulation model with a series of experimental reference (i.e. non passivated) and passivated UT-CIGS cells to decouple the crucial parameters of the passivation. The simulation results follow the experimental trends both for the current in the dark and for the PV parameters under illumination, highlighting the beneficial effects of the passivation on the cell performances. Furthermore, it stresses the influence of the passivation quality at the Al2O3/CIGS interface and of the contact resistance at the Mo/CIGS interface within the openings. Further simulations quantify significant improvements in short-circuit current and open-circuit voltage for different sizes of openings in the Al2O3 layer, relative to an excellent passivation quality (i.e. high density of negative charges in the passivation layer). However, a degradation of performances is predicted for a poor passivation (i.e. low density of such charges) or a high contact resistance, when compared to reference cells. Consequently, we point out an optimum in efficiency when varying the opening widths at fixed hole pitch and fixed contact resistance. At equivalent contact resistance, simulations predict that the sizes of the pitch and openings can be increased without optimal performance losses when maintaining a width to pitch ratio around 0.2. This simulation trend has been confirmed by a series of experiments, indicating that it is crucial to care about the dimensions of the opening grid and the contact resistance of passivated cells apart from different material properties. These simulation results provide significant insights for optimal cell design and characterizations of passivated UT-CIGS PV cells.