Terahertz thickness measurement of multiple-layered coatings - Archive ouverte HAL
Communication Dans Un Congrès Année : 2020

Terahertz thickness measurement of multiple-layered coatings

Min Zhai
  • Fonction : Auteur
A. Locquet
Cyrielle Roquelet
  • Fonction : Auteur
D.S. S Citrin

Résumé

Terahertz pulse reflectometry was employed to characterize the individual layers on metallic substrates. The autoregressive spectral extrapolation based on the modified covariance method was applied to enhance the axial resolution. All coating layers were resolved successfully and the calculated thickness of each layer based on deconvolved results shows a good agreement with the thickness value measured by eddy current technique, highlighting the promising application of terahertz technique on quality control among steel industries.
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Dates et versions

hal-03085975 , version 1 (22-12-2020)

Identifiants

  • HAL Id : hal-03085975 , version 1

Citer

Min Zhai, A. Locquet, Cyrielle Roquelet, D.S. S Citrin. Terahertz thickness measurement of multiple-layered coatings. IRMMW-THz ( 45th International Conference on Infrared, Millimeter, and Terahertz Waves), Nov 2020, Boulder (virtual), United States. ⟨hal-03085975⟩
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