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Article Dans Une Revue Microelectronics Reliability Année : 2019

Learning-Based Reliability Assessment Method for Detection of Permanent Faults in Clockless Circuits

Résumé

Permanent faults are a common issue of contemporary CMOS circuits during fabrication and its lifetime. In order to detect these faults, designers adopt logic and delay-oriented testing approaches to validate the circuit's structure. However, for clockless (i.e. asynchronous) circuits, applying well-known testing approaches is not trivial and bring undesirable overheads. To overcome that, the proposed method in this paper leverages the current signature properties of asynchronous circuits to detect permanent resistive-based faults. Through simulation experiments, we show the natural ability of asynchronous circuits in providing useful current signatures for identifying the presence of resistive-based faults. Moreover, the results demonstrate that our testing technique requires no extra circuitry or power ports to detect resistive-short faults <= 3k Omega and resistive-open faults >= 70k Omega.
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Dates et versions

hal-03080316 , version 1 (21-12-2021)

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Paternité - Pas d'utilisation commerciale

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R. Aquino Guazzelli, Matheus Garay Trindade, Laurent Fesquet, Rodrigo Possamai Bastos. Learning-Based Reliability Assessment Method for Detection of Permanent Faults in Clockless Circuits. Microelectronics Reliability, 2019, 100, ⟨10.1016/j.microrel.2019.06.057⟩. ⟨hal-03080316⟩

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