Optics-free focusing down to micrometer spot size and spectral filtering of XUV harmonics
Résumé
Controlling the wavefront of an extreme ultraviolet (XUV) high-order harmonic beam during the generation process offers to focus the beam without resorting to any XUV optics. By characterizing the XUV intensity profile and wavefront, we quantitatively retrieve both the size and the position of the waist of each generated harmonics and show that optics-free focusing leads to focused XUV spot with micrometer size. We use this remarkable coherent effect to demonstrate efficient and adjustable spectral filtering of the XUV light, along with a strong rejection of the fundamental beam, without using any XUV optics.
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