Analysis of Parasitic Elements in Power Modules Based on GaN Components - Archive ouverte HAL
Communication Dans Un Congrès Année : 2020

Analysis of Parasitic Elements in Power Modules Based on GaN Components

Résumé

This paper aims to evaluate a GaN based power module for automotive applications. Simulations and experiments were then performed on a classical double pulse test bench. In regard to EMC, the oscillations on the Vds after device turn-off is quite important. The comparison between a simulation without considering the 3D wiring model and a simulation by considering the wiring elements is presented. The impact of the parasitic elements modelling is seen through the resonance frequencies found. Experimental results of operation of the converter are presented to validate the simulation approach.
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Dates et versions

hal-02945892 , version 1 (22-09-2020)

Identifiants

  • HAL Id : hal-02945892 , version 1

Citer

Joao Oliveira, Hervé Morel, Dominique Planson, Florent Loiselay. Analysis of Parasitic Elements in Power Modules Based on GaN Components. PCIM Europe 2020, Jul 2020, Nuremberg, Germany. ⟨hal-02945892⟩
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