Article Dans Une Revue Current Opinion in Solid State and Materials Science Année : 2020

X-Ray Orientation Microscopy using Topo-tomography and multi-mode Diffraction Contrast Tomography

Résumé

Polycrystal orientation mapping techniques based on full-field acquisition schemes like X-ray Diffraction Contrast Tomography and certain other variants of 3D X-Ray Diffraction or near-field High Energy Diffraction Microscopy enable time efficient mapping of 3D grain microstructures. The spatial resolution obtained with this class of monochromatic beam X-ray diffraction imaging approaches remains typically below the ultimate spatial resolution achievable with X-ray imaging detectors. Introducing a generalised reconstruction framework enabling the combination of acquisitions with different detector pixel size and sample tilt settings provide a pathway towards 3D orientation mapping with a spatial resolution approaching the one of state of the art X-ray imaging detector systems.

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hal-02926164 , version 1 (31-08-2020)

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  • HAL Id : hal-02926164 , version 1

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Nicola Viganò, Wolfgang Ludwig. X-Ray Orientation Microscopy using Topo-tomography and multi-mode Diffraction Contrast Tomography. Current Opinion in Solid State and Materials Science, 2020, 24, pp.100832. ⟨hal-02926164⟩
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