High Reflectance Nanoscale V/Sc Multilayer for Soft X-ray Water Window Region
Qiushi Huang
(1)
,
Qiang Yi
(2)
,
Zhaodong Cao
(3)
,
Runze Qi
(1)
,
Rolf Loch
(4)
,
Philippe Jonnard
(5)
,
Meiyi Wu
(6)
,
Angelo Giglia
(7)
,
Wenbin Li
(1)
,
Eric Louis
(8)
,
Fred Bijkerk
(8)
,
Zhong Zhang
(1)
,
Zhanshan Wang
(1)
1
Institute of Precision Optical Engineering, Department of Physics
2 Southwest Institute of Nuclear Physics and Chemistry [Mianyang]
3 Shanghai Institute of laser plasma
4 MPSD - Max Planck Institute for the Structure and Dynamics of Matter
5 LCPMR - Laboratoire de Chimie Physique - Matière et Rayonnement
6 LCPMR - Laboratoire de Chimie Physique - Matière et Rayonnement
7 TASC - Laboratorio Nazionale TASC
8 MESA+ - Institute for Nanotechnology
2 Southwest Institute of Nuclear Physics and Chemistry [Mianyang]
3 Shanghai Institute of laser plasma
4 MPSD - Max Planck Institute for the Structure and Dynamics of Matter
5 LCPMR - Laboratoire de Chimie Physique - Matière et Rayonnement
6 LCPMR - Laboratoire de Chimie Physique - Matière et Rayonnement
7 TASC - Laboratorio Nazionale TASC
8 MESA+ - Institute for Nanotechnology
Philippe Jonnard
- Fonction : Auteur
- PersonId : 3510
- IdHAL : philippe-jonnard
- ORCID : 0000-0001-6162-1706
- IdRef : 089424697
Zhanshan Wang
- Fonction : Auteur
- PersonId : 923489