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Journal Articles X-Ray Spectrometry Year : 1989

Quantitative elemental analysis of thick samples by XRF and PIXE

G. Barreira
  • Function : Author
M. Guerra
L. Alves

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hal-02920382 , version 1 (24-08-2020)

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F. Gil, G. Barreira, M. Guerra, L. Alves. Quantitative elemental analysis of thick samples by XRF and PIXE. X-Ray Spectrometry, 1989, 18 (4), pp.157-164. ⟨10.1002/xrs.1300180406⟩. ⟨hal-02920382⟩
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