Journal Articles
X-Ray Spectrometry
Year : 1989
Maria Filomena Guerra : Connect in order to contact the contributor
https://hal.science/hal-02920382
Submitted on : Monday, August 24, 2020-4:02:20 PM
Last modification on : Wednesday, December 1, 2021-2:36:41 PM
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F. Gil, G. Barreira, M. Guerra, L. Alves. Quantitative elemental analysis of thick samples by XRF and PIXE. X-Ray Spectrometry, 1989, 18 (4), pp.157-164. ⟨10.1002/xrs.1300180406⟩. ⟨hal-02920382⟩
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