Thick multi-layers analysis using high energy PIXE
Résumé
A method for multi-layer analysis using high energy PIXE is described. It is based on the variation of the Ka Kb ratio as a function of the detection angle. Experiments have been carried out at the ARRONAX cyclotron using 70 MeV protons in order to validate this method. The thicknesses and the sequences of simple multi-layers targets and more complex targets with hidden layers have been determined using this method.
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