Grazing-angle reflectivity setup for the low-temperature infrared spectroscopy of two-dimensional systems
Résumé
A new optical setup is described that allows the reflectivity at grazing incidence to be measured, including ultrathin films and two-dimensional electron systems (2DES) down to liquid-helium temperatures, by exploiting the Berreman effect and the high brilliance of infrared synchrotron radiation. This apparatus is well adapted to detect the absorption of a 2DES of nanometric thickness, namely that which forms spontaneously at the interface between a thin film of LaAlO 3 and its SrTiO 3 substrate, and to determine its Drude parameters.
Domaines
CristallographieOrigine | Fichiers éditeurs autorisés sur une archive ouverte |
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