A new high-throughput approach to characterize Presence/Absence Variant in Maize based on Affymetrix technology - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2015

A new high-throughput approach to characterize Presence/Absence Variant in Maize based on Affymetrix technology

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hal-02795342 , version 1 (05-06-2020)

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  • HAL Id : hal-02795342 , version 1
  • PRODINRA : 481655

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Stephane S. Nicolas, Aude Darracq, Ali Pirani, Hélène Rimbert, Clément Mabire, et al.. A new high-throughput approach to characterize Presence/Absence Variant in Maize based on Affymetrix technology. Workshop Series DynaGeV (Dynamique des Génomes Végétaux), May 2015, Toulouse, France. ⟨hal-02795342⟩
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