Conference Papers
Year : 2019
Lucas BREDER TEIXEIRA : Connect in order to contact the contributor
https://hal.science/hal-02612013
Submitted on : Monday, May 18, 2020-6:45:32 PM
Last modification on : Wednesday, September 11, 2024-2:10:03 PM
Dates and versions
Identifiers
- HAL Id : hal-02612013 , version 1
Cite
Lucas Breder Teixeira, Jean Gillibert, Eric Blond, Thomas Sayet. Creep characterization of refractory materials at high temperatures using the Integrated Digital Image Correlation. United International Technical Conference of Refractories, Oct 2019, Yokohama, Japan. ⟨hal-02612013⟩
Collections
77
View
0
Download