Creep characterization of refractory materials at high temperatures using the Integrated Digital Image Correlation - Archive ouverte HAL
Conference Papers Year : 2019

Creep characterization of refractory materials at high temperatures using the Integrated Digital Image Correlation

Lucas Breder Teixeira
  • Function : Author
  • PersonId : 1217300
  • IdRef : 267132360
Jean Gillibert
Eric Blond
Thomas Sayet
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Dates and versions

hal-02612013 , version 1 (18-05-2020)

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  • HAL Id : hal-02612013 , version 1

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Lucas Breder Teixeira, Jean Gillibert, Eric Blond, Thomas Sayet. Creep characterization of refractory materials at high temperatures using the Integrated Digital Image Correlation. United International Technical Conference of Refractories, Oct 2019, Yokohama, Japan. ⟨hal-02612013⟩
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