Tailored Voltage Waveform Capacitively-Coupled Plasmas for IEDF and electron density control: Application to Microcrystalline Si Deposition - Archive ouverte HAL
Communication Dans Un Congrès Année : 2013

Tailored Voltage Waveform Capacitively-Coupled Plasmas for IEDF and electron density control: Application to Microcrystalline Si Deposition

Jean-Paul Booth
Erik Johnson
Trevor Lafleur

Résumé

Oral
Fichier non déposé

Dates et versions

hal-02573289 , version 1 (14-05-2020)

Identifiants

  • HAL Id : hal-02573289 , version 1

Citer

Jean-Paul Booth, Erik Johnson, Trevor Lafleur, Pierre-Alexandre Delattre. Tailored Voltage Waveform Capacitively-Coupled Plasmas for IEDF and electron density control: Application to Microcrystalline Si Deposition. Semicon Korea, Jan 2013, Seoul, Korea, Unknown Region. ⟨hal-02573289⟩
43 Consultations
0 Téléchargements

Partager

More