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Journal Articles Inverse Problems and Imaging Year : 2021

Imaging junctions of waveguides

Abstract

In this paper we address the identification of defects by the Linear Sampling Method in half-waveguides which are related to each other by junctions. Firstly a waveguide which is characterized by an abrupt change of properties is considered, secondly the more difficult case of several half-waveguides related to each other by a junction of complex geometry. Our approach is illustrated by some two-dimensional numerical experiments.
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Dates and versions

hal-02567182 , version 1 (11-05-2020)

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Laurent Bourgeois, Jean-François Fritsch, Arnaud Recoquillay. Imaging junctions of waveguides. Inverse Problems and Imaging , 2021, ⟨10.3934/ipi.2020065⟩. ⟨hal-02567182⟩
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