Effect of Ferromagnetic Material on the Reduction of Parasitic Emission in Near Field - Archive ouverte HAL
Article Dans Une Revue Ferroelectrics Année : 2008

Effect of Ferromagnetic Material on the Reduction of Parasitic Emission in Near Field

Résumé

In this article the results of measurement in near-field concerning a 16-bit microcontroller from Freescale are reported, with and without a film of ferromagnetic material (Permalloy) plated against the surface of its package. This material improves near-field electromagnetic compatibility performances by reducing, in good proportion, the parasitic emission.
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Dates et versions

hal-02523683 , version 1 (29-03-2020)

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L. Bouhouch, A. Boyer, Sonia Ben Dhia, Etienne Sicard, M. Fadel. Effect of Ferromagnetic Material on the Reduction of Parasitic Emission in Near Field. Ferroelectrics, 2008, 371 (1), pp.133-138. ⟨10.1080/00150190802397791⟩. ⟨hal-02523683⟩
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