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Communication Dans Un Congrès Année : 2019

Comparison of Voltages Induced in an Electronic Equipment during Far Field and Near Field Normative Radiated Immunity Tests

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hal-02515648 , version 1 (23-03-2020)

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  • HAL Id : hal-02515648 , version 1

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A. Durier, S. Ben Dhia, T. Dubois. Comparison of Voltages Induced in an Electronic Equipment during Far Field and Near Field Normative Radiated Immunity Tests. Proceedings of EMC Europe, 2019, 2019, Barcelona, Spain. ⟨hal-02515648⟩
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