Study of the Coupling of Wide Band Near Field Scan Probe Dedicated to the Investigation of the Radiated Immunity of Printed Circuit Boards - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2019

Study of the Coupling of Wide Band Near Field Scan Probe Dedicated to the Investigation of the Radiated Immunity of Printed Circuit Boards

Fichier non déposé

Dates et versions

hal-02515627 , version 1 (23-03-2020)

Identifiants

  • HAL Id : hal-02515627 , version 1

Citer

A. Durier, S. Ben Dhia, T. Dubois. Study of the Coupling of Wide Band Near Field Scan Probe Dedicated to the Investigation of the Radiated Immunity of Printed Circuit Boards. Proceedings of SPI, 2019, 2019, Chambéry, France. ⟨hal-02515627⟩
8 Consultations
0 Téléchargements

Partager

Gmail Facebook X LinkedIn More