Trojan Detection Test for Clockless Circuits - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Journal of Electronic Testing: : Theory and Applications Année : 2020

Trojan Detection Test for Clockless Circuits

Résumé

Clockless integrated circuits, as any type of integrated system, might today carry hardware Trojan (HT) circuits maliciously implanted in the designs during outsourced phases of fabrication. This paper proposes a testing technique dedicated to detect HTs in clockless circuits fabricated in CMOS technologies. The proposed technique applies a well-known machine learning approach – One-Class Support Vector Machine (OC-SVM) – for dealing with the particular current signature features of clockless circuits. Through simulation experiments we show the natural ability of clockless circuits in providing individual current signatures for identifying the presence of HTs. Moreover, the results demonstrate that our testing technique requires no extra circuitry or power ports to detect HTs of a few dozens of transistors in designs under Trojan test with more than 13 thousand transistors.
Fichier non déposé

Dates et versions

hal-02472910 , version 1 (10-02-2020)

Licence

Paternité - Pas d'utilisation commerciale

Identifiants

Citer

R. Aquino Guazzelli, Matheus Garay Trindade, Leonel Acunha Guimarães, Thiago Ferreira de Paiva Leite, Laurent Fesquet, et al.. Trojan Detection Test for Clockless Circuits. Journal of Electronic Testing: : Theory and Applications, 2020, ⟨10.1007/s10836-020-05857-6⟩. ⟨hal-02472910⟩

Collections

UGA CNRS TIMA
55 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More