Progress on a Surface-Electrode Ion Trap for Optical Frequency Metrology - Archive ouverte HAL
Communication Dans Un Congrès Année : 2019

Progress on a Surface-Electrode Ion Trap for Optical Frequency Metrology

Résumé

We present our latest results obtained with a surface-electrode ion trap designed for optical frequency metrology. A prototype trap, based on a simple geometry realized on a printed-circuit board, has been successfully used to trap single Yb + ions. Our long-term goal is the realization of a compact single-ion optical clock.

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Dates et versions

hal-02472719 , version 1 (10-02-2020)

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  • HAL Id : hal-02472719 , version 1

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Marion Delehaye, Lucas Groult, Thomas Lauprêtre, Avinash Kumar, Bachir Achi, et al.. Progress on a Surface-Electrode Ion Trap for Optical Frequency Metrology. International Frequency Control Symposium and European Frequency and Time Forum, Apr 2019, Orlando, United States. ⟨hal-02472719⟩
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