High energy PIXE : a powerful tool to characterize multi-layers thick samples - Archive ouverte HAL
Communication Dans Un Congrès Année : 2017

High energy PIXE : a powerful tool to characterize multi-layers thick samples

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hal-02458216 , version 1 (28-01-2020)

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  • HAL Id : hal-02458216 , version 1

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Alexandre Subercaze, Charbel Koumeir, Vincent Métivier, Noël Servagent, Arnaud Guertin, et al.. High energy PIXE : a powerful tool to characterize multi-layers thick samples. 15th International Conference on Particle Induced X-ray Emission (PIXE 2017), Apr 2017, Split, Croatia. ⟨hal-02458216⟩
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