Journal Articles
Defect and Diffusion Forum
Year : 2012
Alain Portavoce : Connect in order to contact the contributor
https://amu.hal.science/hal-02393973
Submitted on : Wednesday, December 4, 2019-3:46:10 PM
Last modification on : Monday, June 10, 2024-4:58:03 PM
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- HAL Id : hal-02393973 , version 1
- DOI : 10.4028/www.scientific.net/DDF.323-325.433
Cite
Alain Portavoce, Christophe Girardeaux, Guy Treglia, Jean Bernardini, Dominique Mangelinck, et al.. Nanometric-Size Effect upon Diffusion and Reaction in Semiconductors: Experimental and Theoretical Investigations. Defect and Diffusion Forum, 2012, 323-325, pp.433-438. ⟨10.4028/www.scientific.net/DDF.323-325.433⟩. ⟨hal-02393973⟩
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