Nanothermometry by Means of Scanning Thermal Microscopy: Investigation of Electro-thermal Devices with Embedded Metallic Lines - Archive ouverte HAL
Communication Dans Un Congrès Année : 2019

Nanothermometry by Means of Scanning Thermal Microscopy: Investigation of Electro-thermal Devices with Embedded Metallic Lines

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hal-02379735 , version 1 (25-11-2019)

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  • HAL Id : hal-02379735 , version 1

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G. Hamaoui, A. Pic, W. Zhao, A. Alkurdi, J. Yin, et al.. Nanothermometry by Means of Scanning Thermal Microscopy: Investigation of Electro-thermal Devices with Embedded Metallic Lines. THERMINIC 26 (Thermal Investigation of ICs and Systems), Sep 2019, Lecco, Italy. ⟨hal-02379735⟩
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