Thermal investigation of nanocontacts by means of Scanning Thermal Microscopy: impact of roughness and amorphous carbon monoatomic layer covering for silicon substrates - Archive ouverte HAL
Poster De Conférence Année : 2019

Thermal investigation of nanocontacts by means of Scanning Thermal Microscopy: impact of roughness and amorphous carbon monoatomic layer covering for silicon substrates

Domaines

Thermique [physics.class-ph]

Pierre-Olivier Chapuis  : Connectez-vous pour contacter le contributeur

https://hal.science/hal-02379716

Soumis le : lundi 25 novembre 2019-18:17:12

Dernière modification le : vendredi 24 novembre 2023-15:52:03

Fichier non déposé

Dates et versions

hal-02379716 , version 1 (25-11-2019)

Identifiants

  • HAL Id : hal-02379716 , version 1

Citer

E. Guen, P. Mangel, N. J. Kaur, P. Vincent, Anthony Ayari, et al.. Thermal investigation of nanocontacts by means of Scanning Thermal Microscopy: impact of roughness and amorphous carbon monoatomic layer covering for silicon substrates. E-MRS Fall Meeting Symposium "Nanomaterials thermal transport properties and nanothermodynamics", Sep 2019, Varsovie, Poland. ⟨hal-02379716⟩

Exporter

BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite

Collections

CNRS UNIV-LYON1 INSA-LYON CETHIL INSA-GROUPE ILM UDL
37 Consultations
0 Téléchargements

Partager

More