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Poster De Conférence Année : 2019

Thermal investigation of nanocontacts by means of Scanning Thermal Microscopy: impact of roughness and amorphous carbon monoatomic layer covering for silicon substrates

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hal-02379716 , version 1 (25-11-2019)

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  • HAL Id : hal-02379716 , version 1

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E. Guen, P. Mangel, N. J. Kaur, P. Vincent, Anthony Ayari, et al.. Thermal investigation of nanocontacts by means of Scanning Thermal Microscopy: impact of roughness and amorphous carbon monoatomic layer covering for silicon substrates. E-MRS Fall Meeting Symposium "Nanomaterials thermal transport properties and nanothermodynamics", Sep 2019, Varsovie, Poland. ⟨hal-02379716⟩
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