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Communication Dans Un Congrès Année : 2019
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hal-02379157 , version 1 (25-11-2019)

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Mathieu Jaoul, David Ney, Didier Celi, Cristell Maneux, Thomas Zimmer. Analysis of a failure mechanism occurring in SiGe HBTs under mixed-mode stress conditions. 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS), Mar 2019, Kita-Kyushu City, Japan. pp.33-37, ⟨10.1109/ICMTS.2019.8730951⟩. ⟨hal-02379157⟩
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