Investigating stress and strain due to operational information systems - Archive ouverte HAL
Communication Dans Un Congrès Année : 2017

Investigating stress and strain due to operational information systems

Résumé

Despite the wealth of research examining the influence of technostress on job outcomes, the mechanisms through which technostress generates strain to impact job outcomes is not clear. Grounding our arguments in the theory of threat bias, we investigate the mechanisms explaining this important relationship and delineate useful implications.
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Dates et versions

hal-02374108 , version 1 (21-11-2019)

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  • HAL Id : hal-02374108 , version 1

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Anuragini Shirish, Shalini Chandra, Shirish C. Srivastava. Investigating stress and strain due to operational information systems. POMS 2017 : 28th Production and Operations Management Society Annual Conference, May 2017, Seattle, Washington, United States. ⟨hal-02374108⟩
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