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Article Dans Une Revue Materialia Année : 2019

Grain boundary diffusion of chromium in polycrystalline nickel studied by SIMS

Résumé

The grain boundary diffusion of chromium in polycrystalline nickel was studied by means of tracer experiments at 346-668 °C. Intensity-depth profiles were recorded by secondary ion mass spectrometry (SIMS), which allowed short diffusion distances, and therefore relatively low temperatures, to be examined. Individual grain boundaries in coarse-grained substrates produced profiles with a variety of shapes, reflecting the variability of diffusivities in a polycrystal, and even within a grain boundary. Average diffusivities were also measured using cold-rolled substrates, which rapidly recrystallized and provided finer microstructures. The simplifying assumptions usually made in processing B regime data were found not to be applicable here, because of the shallow measurement depths. The errors made by using approximate solutions to the diffusion equation are discussed, and a data processing method adapted to the conditions of SIMS measurements is used. A method to study diffusion tails with smooth slope variations is also demonstrated. The measured diffusivities were found to be in agreement with higher temperature data from the literature.

Domaines

Matériaux
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Dates et versions

hal-02350066 , version 1 (05-11-2019)

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Thomas Gheno, François Jomard, Clara Desgranges, Laure Martinelli. Grain boundary diffusion of chromium in polycrystalline nickel studied by SIMS. Materialia, 2019, 6, pp.100283. ⟨10.1016/j.mtla.2019.100283⟩. ⟨hal-02350066⟩
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