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Article Dans Une Revue Review of Scientific Instruments Année : 2018

X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry

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hal-02321789 , version 1 (21-10-2019)

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M. Valdivia, F. Veloso, D. Stutman, C. Stoeckl, C. Mileham, et al.. X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry. Review of Scientific Instruments, 2018, 89 (10), pp.10G127. ⟨10.1063/1.5039342⟩. ⟨hal-02321789⟩
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