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Article Dans Une Revue International Journal of Information Science & Technology Année : 2019

An Improved SPICE Model for the Study of Electro-thermal Static Behavior for two New Generations of SiC MOSFET

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hal-02295925 , version 1 (24-09-2019)

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Wadia Jouha, Pascal Dherbécourt, Ahmed El Oualkadi, Eric Joubert, Mohamed Lamine Masmoudi. An Improved SPICE Model for the Study of Electro-thermal Static Behavior for two New Generations of SiC MOSFET. International Journal of Information Science & Technology, 2019, ⟨10.57675/IMIST.PRSM/ijist-v3i1.44⟩. ⟨hal-02295925⟩
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