Deep metallic interdiffusion in a model ferromagnetic/molecular system
Résumé
Understanding the structure of ferromagnetic/molecular interfaces obtained by the deposition of metal on a molecular layer is a key parameter to master for the development of molecular spintronic devices. Here we studied by means of grazing incidence x-ray diffraction and x-ray reflectivity a model Co/C60/Co(0001) system. Prior to Co deposition, the grown C60 layer is crystallized in a face centered cubic lattice with the presence of two twins. The Co overlayer, presenting a polycrystalline hexagonal close packed structure with stacking faults, induces an amorphization of the topmost C60 layers. Most importantly, we observe a deep diffusion of Co atoms in the octahedral sites of the crystallized C60 film which could strongly affect the spin transport properties of the molecular layer and thus the magnetoresistance of the final device.