Use of X-ray micro computed tomography imaging to analyze the morphology of wheat grain through its development - Archive ouverte HAL
Communication Dans Un Congrès Année : 2019

Use of X-ray micro computed tomography imaging to analyze the morphology of wheat grain through its development

Résumé

Use of X-ray micro computed tomography imaging to analyze the morphology of wheat grain through its development. 3. NEUBIAS Conference
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Dates et versions

hal-02289525 , version 1 (16-09-2019)

Identifiants

  • HAL Id : hal-02289525 , version 1
  • PRODINRA : 483205

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Thang Duong Quoc Le, Camille Alvarado, Christine Girousse, David Legland, Anne Laure Chateigner-Boutin. Use of X-ray micro computed tomography imaging to analyze the morphology of wheat grain through its development. 3. NEUBIAS Conference, Feb 2019, Luxembourg, France. ⟨hal-02289525⟩
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