Article Dans Une Revue Crystal Engineering Année : 2002

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hal-02179095 , version 1 (10-07-2019)

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P. Goudeau, P. Laffez, Mustapha Zaghrioui, E. Elkaim, P. Ruello. X-ray diffraction investigation of the relationship between strains and metal-insulator transition in NdNiO3 thin films. Crystal Engineering, 2002, 5 (3-4), pp.317-325. ⟨10.1016/S1463-0184(02)00043-6⟩. ⟨hal-02179095⟩
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