Growth and Characterization of Undoped Polysilicon Thick Layers: Revisiting an Old System - Archive ouverte HAL
Article Dans Une Revue Silicon Année : 2019

Growth and Characterization of Undoped Polysilicon Thick Layers: Revisiting an Old System

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hal-02174546 , version 1 (05-07-2019)

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Taguhi Yeghoyan, Kassem Alassaad, Véronique Soulière, Thierry Douillard, Davy Carole, et al.. Growth and Characterization of Undoped Polysilicon Thick Layers: Revisiting an Old System. Silicon, 2019, ⟨10.1007/s12633-019-00209-2⟩. ⟨hal-02174546⟩
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