Learning-Based Reliability Assessment Method for Detection of Permanent Faults in Clockless Circuits - Archive ouverte HAL
Communication Dans Un Congrès Année : 2019
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hal-02165113 , version 1 (25-06-2019)

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  • HAL Id : hal-02165113 , version 1

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R. Aquino Guazzelli, Matheus Garay Trindade, Laurent Fesquet, Rodrigo Possamai Bastos. Learning-Based Reliability Assessment Method for Detection of Permanent Faults in Clockless Circuits. 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2019), Aug 2019, Toulouse, France. ⟨hal-02165113⟩

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