Remaining Useful Life Prognosis of Supercapacitors Under Temperature and Voltage Aging Conditions - Archive ouverte HAL
Journal Articles IEEE Transactions on Industrial Electronics Year : 2018
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hal-02147123 , version 1 (04-06-2019)

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Asmae El Mejdoubi, Hicham Chaoui, Jalal Sabor, Hamid Gualous. Remaining Useful Life Prognosis of Supercapacitors Under Temperature and Voltage Aging Conditions. IEEE Transactions on Industrial Electronics, 2018, 65 (5), pp.4357-4367. ⟨10.1109/TIE.2017.2767550⟩. ⟨hal-02147123⟩
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