Communication Dans Un Congrès Année : 2015

Deviation from threshold model in ultrafast laser ablation of graphene at sub-micron scale

Résumé

We investigate a method to measure ultrafast laser ablation threshold with respect to spot size. We use structured complex beams to generate a pattern of craters in CVD graphene with a single laser pulse. A direct comparison between beam profile and SEM characterization allows us to determine the dependence of ablation probability on spot-size, for crater diameters ranging between 700 nm and 2.5 μm. We report a drastic decrease of ablation probability when the crater diameter is below 1 μm which we explain by free-carrier diffusion.

Fichier principal
Vignette du fichier
65af40ac-946e-4a2b-8008-b95d2a482d70-author.pdf (456.44 Ko) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)
Licence
Loading...

Dates et versions

hal-02134929 , version 1 (20-05-2019)

Licence

Identifiants

  • HAL Id : hal-02134929 , version 1

Citer

Abel Villalba, Chen Xie, Roland Salut, Luca Furfaro, Remo Giust, et al.. Deviation from threshold model in ultrafast laser ablation of graphene at sub-micron scale. Conference on Lasers and Electro-Optics and European Quantum Electronics Conference, Jun 2015, Munich, Germany. ⟨hal-02134929⟩
70 Consultations
247 Téléchargements

Partager

  • More