Article Dans Une Revue Semiconductor Science and Technology Année : 2018

Transmission electron microscopy of Ga(Sb, Bi)/GaSb quantum wells with varying Bi content and quantum well thickness

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hal-02080292 , version 1 (26-03-2019)

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E. Luna, O. Delorme, L. Cerutti, E. Tournié, J-B Rodriguez, et al.. Transmission electron microscopy of Ga(Sb, Bi)/GaSb quantum wells with varying Bi content and quantum well thickness. Semiconductor Science and Technology, 2018, 33 (9), pp.094006. ⟨10.1088/1361-6641/aad5c4⟩. ⟨hal-02080292⟩
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