ToF-SIMS studies of the TiO 2 -ZrO 2 supported palladium as trace level used in the total oxidation of TCE in humid air - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Surface and Interface Analysis Année : 2013

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hal-02042978 , version 1 (20-02-2019)

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N. Nuns, J.-F. Lamonier, J.-M. Giraudon, Stéphane Siffert, B.-L. Su. ToF-SIMS studies of the TiO 2 -ZrO 2 supported palladium as trace level used in the total oxidation of TCE in humid air. Surface and Interface Analysis, 2013, 45 (1), pp.566-569. ⟨10.1002/sia.5109⟩. ⟨hal-02042978⟩
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