Scanning Thermal Microscopy: state of the art, main challenges and application to the characterization of TE materials - Archive ouverte HAL Access content directly
Other Publications Year : 2018

Scanning Thermal Microscopy: state of the art, main challenges and application to the characterization of TE materials

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hal-02024099 , version 1 (18-02-2019)

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  • HAL Id : hal-02024099 , version 1

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Séverine Gomès. Scanning Thermal Microscopy: state of the art, main challenges and application to the characterization of TE materials. 2018. ⟨hal-02024099⟩
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