Communication Dans Un Congrès Année : 2015

In Situ X-Ray Scattering and Optical Substrate Curvature Studies of ZnO Growth by Atomic Layer and Metal Organic Chemical Vapor Deposition

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hal-02016958 , version 1 (13-02-2019)

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  • HAL Id : hal-02016958 , version 1

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Hubert Renevier, R. Boichot, A. Crisci, L. Tian, Ahmad Chaker, et al.. In Situ X-Ray Scattering and Optical Substrate Curvature Studies of ZnO Growth by Atomic Layer and Metal Organic Chemical Vapor Deposition. MRS spring meeting, Apr 2015, San Francisco, United States. ⟨hal-02016958⟩
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