Statistical Analysis of Secondary Electron Spectroscopic Images Using Ultra-Low Energies Reveal Nanoscale Surface Morphology of Functional Organic Blends - Archive ouverte HAL
Journal Articles Microscopy and Microanalysis Year : 2018

Statistical Analysis of Secondary Electron Spectroscopic Images Using Ultra-Low Energies Reveal Nanoscale Surface Morphology of Functional Organic Blends

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  • HAL Id : hal-02001217 , version 1

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Jochen Kammerer, Riva Alkarsifi, Christine Videlot-Ackermann, Olivier Margeat, Bernd Schindler, et al.. Statistical Analysis of Secondary Electron Spectroscopic Images Using Ultra-Low Energies Reveal Nanoscale Surface Morphology of Functional Organic Blends. Microscopy and Microanalysis, 2018, 24 (S1), pp.628-629. ⟨hal-02001217⟩
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