Statistical Analysis of Secondary Electron Spectroscopic Images Using Ultra-Low Energies Reveal Nanoscale Surface Morphology of Functional Organic Blends - Archive ouverte HAL
Journal Articles Microscopy and Microanalysis Year : 2018

Statistical Analysis of Secondary Electron Spectroscopic Images Using Ultra-Low Energies Reveal Nanoscale Surface Morphology of Functional Organic Blends

Jochen Kammerer
  • Function : Author
Riva Alkarsifi
Centre Interdisciplinaire de Nanoscience de Marseille
Christine Videlot-Ackermann
Centre Interdisciplinaire de Nanoscience de Marseille
Olivier Margeat
Centre Interdisciplinaire de Nanoscience de Marseille
CV
Bernd Schindler
  • Function : Author
Irene Wacker
  • Function : Author
Jörg Ackermann
Centre Interdisciplinaire de Nanoscience de Marseille
Rasmus Schroder
  • Function : Author
Martin Pfannmoller
  • Function : Author

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Engineering Sciences [physics] Optics / Photonic

Christine Videlot-Ackermann  : Connect in order to contact the contributor

https://hal.science/hal-02001217

Submitted on : Thursday, January 31, 2019-10:47:01 AM

Last modification on : Wednesday, July 10, 2024-4:10:15 PM

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  • HAL Id : hal-02001217 , version 1

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Jochen Kammerer, Riva Alkarsifi, Christine Videlot-Ackermann, Olivier Margeat, Bernd Schindler, et al.. Statistical Analysis of Secondary Electron Spectroscopic Images Using Ultra-Low Energies Reveal Nanoscale Surface Morphology of Functional Organic Blends. Microscopy and Microanalysis, 2018, 24 (S1), pp.628-629. ⟨hal-02001217⟩

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