Radiation Hardened by Design Pipeline Analog-to-Digital Converter Blocks in CMOS HV 0.18µm Technology
Résumé
In this paper, we present an approach to achieve radiation hardening by design (RHBD) for the main three blocks involved in pipelined Analog-to-Digital converters (ADCs): switches, comparators and residue amplifiers. A method to design bootstrapped switches has been devised to avoid voltage overshoots. Dual path with auto-zero techniques have been implemented for the comparators to be less prone to single effect upset (SEU). Finally, predictive switched capacitor techniques have been used for the residue amplifier in order to benefit from a simpler low-power amplifier architecture. To verify the proposed methodology, these blocks were implemented in an HV 0.18μm CMOS technology.
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