A Blind Quality Measure for Industrial 2D Matrix Symbols Using Shallow Convolutional Neural Network - Archive ouverte HAL Access content directly
Conference Papers Year : 2018
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hal-01970892 , version 1 (06-01-2019)

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  • HAL Id : hal-01970892 , version 1

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Zhaohui Che, Guangtao Zhai, Liu Jing, Ke Gu, Patrick Le Callet, et al.. A Blind Quality Measure for Industrial 2D Matrix Symbols Using Shallow Convolutional Neural Network. 25th IEEE International Conference on Image Processing (ICIP), 2018, Athenes, Greece. ⟨hal-01970892⟩
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