Single Event Effects Analysis in Readout Integrated Circuits at Cryogenic Temperatures - Archive ouverte HAL
Communication Dans Un Congrès Année : 2018

Single Event Effects Analysis in Readout Integrated Circuits at Cryogenic Temperatures

Résumé

This work presents the analyses of single event transients and functional interrupts measured on two designs of readout integrated circuit under a heavy ions beam cooled down at cryogenic temperatures. The analysis of the multiplicity of SETs in the pixel arrays is completed by means of the SEE prediction tool, MUSCA SEP3.
Fichier principal
Vignette du fichier
DPHY18181.1542965461.pdf (592.88 Ko) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)
Loading...

Dates et versions

hal-01957135 , version 1 (17-12-2018)

Identifiants

  • HAL Id : hal-01957135 , version 1

Citer

Laurent Artola, S. Ducret, Ahmad Al Youssef, R. Buiron, F. Perrier, et al.. Single Event Effects Analysis in Readout Integrated Circuits at Cryogenic Temperatures. AMICSA 2018, Jun 2018, LOUVAIN, Belgium. ⟨hal-01957135⟩

Collections

DPHY_ONERA
39 Consultations
103 Téléchargements

Partager

More