Article Dans Une Revue Thin Solid Films Année : 2018

Buckle depression as a signature of Young’s modulus mismatch between a film and its substrate

Résumé

The buckling structures of rigid films on soft substrates exhibit a “mexican hat” shape characterized by a nanometer scale depression at both edges. Based on finite elements simulations, a mathematical formulation is proposed to extract the elastic modulus mismatch between the film and its substrate, from the fine characterization of the buckle morphology.

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hal-01957123 , version 1 (13-04-2024)

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Romain Boijoux, Guillaume Parry, C. Coupeau. Buckle depression as a signature of Young’s modulus mismatch between a film and its substrate. Thin Solid Films, 2018, 645, pp.379-382. ⟨10.1016/j.tsf.2017.11.011⟩. ⟨hal-01957123⟩
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