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Poster De Conférence Année : 2018

Dynamics of Si surface nanostructures under electromigration

Résumé

Mass transport processes play an important role in nano devices. They determine the morphology and the stability of a working device, and eventually its lifetime. When a direct electric current is applied to a material, it affects the mass transport by adding a bias to the atomic diffusive motion. This effect, called electromigration, can play an important role on the dynamics and the morphological stability of nanostructures at surfaces. In this work we have studied the motion of single-step holes and islands under the effect of an electric field on Si(100), in real time, by Low Energy Electron Microscopy (LEEM). The details of the motion depend on the strong diffusion anisotropy of the Si dimer rows. Studying the velocity and the shape of the nanostructures, we discuss a model to explain and guide the motion of holes and islands. The poster is based on the paper: "2D nanostructure motion on anisotropic surfaces controlled by electromigration" by S. Curiotto et al. published on Applied Surface Science 469 (2019) 463-470
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Dates et versions

hal-01955777 , version 1 (14-12-2018)

Identifiants

  • HAL Id : hal-01955777 , version 1

Citer

Stefano Curiotto, Ali El-Barraj, Fabien Cheynis, Pierre Muller, Frédéric Leroy. Dynamics of Si surface nanostructures under electromigration. C'Nano : The Nanoscience Meeting, Dec 2018, Toulon, France. 2019. ⟨hal-01955777⟩
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