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Article Dans Une Revue Nanotechnology Année : 2019

Bottom-up fabrication of InAs-on-nothing MOSFET using selective area molecular beam epitaxy

Résumé

In this paper we report on the fabrication and electrical characterization of InAs-on-nothing metal-oxide-semiconductor field-effect transistor composed of a suspended InAs channel and raised InAs n+ contacts. This architecture is obtained using 3D selective and localized molecular beam epitaxy on a lattice mismatched InP substrate. The suspended InAs channel and InAs n+ contacts feature a reproducible and uniform shape with well-defined 3D sidewalls. Devices with 1 μm gate length present a saturation drain current (I Dsat) of 300 mA mm−1 at V DS = 0.8 V and a trans-conductance (GM ) of 120 mS mm−1 at V DS = 0.5 V. In terms of electrostatic control, the devices display a minimal subthreshold swing of 110 mV dec−1 at V DS = 0.5 V and a small drain induced barrier lowering of 50 mV V−1.

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Dates et versions

hal-01955057 , version 1 (14-12-2018)

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Matej Pastorek, Aurélien Olivier, Yoann Lechaux, Nicolas Wichmann, Theano Karatsori, et al.. Bottom-up fabrication of InAs-on-nothing MOSFET using selective area molecular beam epitaxy. Nanotechnology, 2019, 30 (3), pp.035301. ⟨10.1088/1361-6528/aaebbd⟩. ⟨hal-01955057⟩
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